Monitoring the Phase Evolution of Yttria Stabilized Zirconia in Thermal Barrier Coatings Using the Rietveld Method

  1. Uwe Schulz,
  2. Hua-Tay Lin,
  3. Jonathan Salem and
  4. Dongming Zhu
  1. G. Witz1,
  2. V. Shklover1,
  3. W. Steurer1,
  4. S. Bachegowda2 and
  5. H.-P. Bossmann2

Published Online: 14 DEC 2009

DOI: 10.1002/9780470339510.ch5

Advanced Ceramic Coatings and Interfaces II: Ceramic and Engineering Science Proceedings, Volume 28, Issue 3

Advanced Ceramic Coatings and Interfaces II: Ceramic and Engineering Science Proceedings, Volume 28, Issue 3

How to Cite

Witz, G., Shklover, V., Steurer, W., Bachegowda, S. and Bossmann, H.-P. (2007) Monitoring the Phase Evolution of Yttria Stabilized Zirconia in Thermal Barrier Coatings Using the Rietveld Method, in Advanced Ceramic Coatings and Interfaces II: Ceramic and Engineering Science Proceedings, Volume 28, Issue 3 (eds U. Schulz, H.-T. Lin, J. Salem and D. Zhu), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470339510.ch5

Author Information

  1. 1

    Laboratory of Crystallography, ETH Zürich, Wolfgang-Pauli-Str. 10, Zürich, 8093 Zürich, Switzerland

  2. 2

    Aistom (Schweiz) AG, Brown Bovery Str. 7, Baden, 5401 Baden, Switzerland

Publication History

  1. Published Online: 14 DEC 2009
  2. Published Print: 29 OCT 2007

ISBN Information

Print ISBN: 9780470196342

Online ISBN: 9780470339510

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Keywords:

  • plasma sprayed thermal barrier coating;
  • Yttria stabilized zirconia;
  • thermal conductivity;
  • x-ray diffraction;
  • thermal barrier coatings

Summary

This chapter contains sections titled:

  • Abstract

  • Introduction

  • Experimetal Procedure

  • Results and Discussion

  • Conclusions

  • References