Chapter 5. Analog and Mixed-Signal Circuit Design for Yield and Manufacturability
Published Online: 7 FEB 2008
DOI: 10.1002/9780470382820.ch5
Copyright © 2009 John Wiley & Sons, Inc.
Book Title
Nano-CMOS Design for Manufacturabililty: Robust Circuit and Physical Design for Sub-65 nm Technology Nodes
Additional Information
How to Cite
Wong, B., Zach, F., Moroz, V., Mittal, A., Starr, G. and Kahng, A. (2008) Analog and Mixed-Signal Circuit Design for Yield and Manufacturability, in Nano-CMOS Design for Manufacturabililty: Robust Circuit and Physical Design for Sub-65 nm Technology Nodes, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470382820.ch5
Publication History
- Published Online: 7 FEB 2008
- Published Print: 6 OCT 2008
ISBN Information
Print ISBN: 9780470112809
Online ISBN: 9780470382820
- Summary
- Chapter
- References
Keywords:
- analog and mixed-signal circuit design and yield and manufacturability;
- device matching and design guidelines;
- voltage–controlled oscillator (VCO) and clock data recovery (CDR) circuit
Summary
This chapter contains sections titled:
Introduction
Device Selection
“Heartbeat” Device Size
Device Matching
Design Guidelines
Layout Guidelines
Testing
References