Chapter 6. Design for Variability, Performance, and Yield
Published Online: 7 FEB 2008
Copyright © 2009 John Wiley & Sons, Inc.
Nano-CMOS Design for Manufacturabililty: Robust Circuit and Physical Design for Sub-65 nm Technology Nodes
How to Cite
Wong, B., Zach, F., Moroz, V., Mittal, A., Starr, G. and Kahng, A. (2008) Design for Variability, Performance, and Yield, in Nano-CMOS Design for Manufacturabililty: Robust Circuit and Physical Design for Sub-65 nm Technology Nodes, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470382820.ch6
- Published Online: 7 FEB 2008
- Published Print: 6 OCT 2008
Print ISBN: 9780470112809
Online ISBN: 9780470382820
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