13. Quantitative Characterization of Localized Amplitude Variations in Silicon Carbide Ceramics Using Ultrasound C-Scan Imaging

  1. Lisa Prokurat Franks
  1. Raymond Brennan1,
  2. James McCauley1,
  3. Richard Haber2 and
  4. Dale Niesz2

Published Online: 1 APR 2009

DOI: 10.1002/9780470456286.ch13

Advances in Ceramic Armor IV: Ceramic Engineering and Science Proceedings, Volume 29, Issue 6

Advances in Ceramic Armor IV: Ceramic Engineering and Science Proceedings, Volume 29, Issue 6

How to Cite

Brennan, R., McCauley, J., Haber, R. and Niesz, D. (2009) Quantitative Characterization of Localized Amplitude Variations in Silicon Carbide Ceramics Using Ultrasound C-Scan Imaging, in Advances in Ceramic Armor IV: Ceramic Engineering and Science Proceedings, Volume 29, Issue 6 (ed L. P. Franks), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470456286.ch13

Author Information

  1. 1

    US Army Research Laboratory, Aberdeen Proving Ground, MD 21005-5066

  2. 2

    Rutgers University, 607 Taylor Road, Piscataway, NJ 08854-8065

Publication History

  1. Published Online: 1 APR 2009
  2. Published Print: 8 DEC 2008

Book Series:

  1. Ceramic Engineering and Science Proceedings

Book Series Editors:

  1. Tatsuki Ohji and
  2. Andrew Wereszczak

ISBN Information

Print ISBN: 9780470344972

Online ISBN: 9780470456286

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Keywords:

  • ultrasound c-scan imaging;
  • ceramic materials;
  • hot pressed silicon carbide;
  • acoustic signals;
  • ceramic material integrity

Summary

This chapter contains sections titled:

  • Abstract

  • Quantitative Threshold Procedure

  • Individual Localized Amplitude Variations in Silicon Carbide

  • Conclusions

  • Acknowledgements

  • References