9. Degradation Phenomena in SOFCs with Metallic Interconnects

  1. Prabhakar Singh,
  2. Narottam P. Bansal,
  3. Tatsuki Ohji and
  4. Andrew Wereszczak
  1. Norbert H. Menzler,
  2. Frank Tietz,
  3. Martin Bram,
  4. Izaak C. Vinke and
  5. L.G.J. Bert de Haart

Published Online: 1 APR 2009

DOI: 10.1002/9780470456309.ch9

Advances in Solid Oxide Fuel Cells IV: Ceramic Engineering and Science Proceedings, Volume 29, Issue 5

Advances in Solid Oxide Fuel Cells IV: Ceramic Engineering and Science Proceedings, Volume 29, Issue 5

How to Cite

Menzler, N. H., Tietz, F., Bram, M., Vinke, I. C. and Bert de Haart, L.G.J. (2008) Degradation Phenomena in SOFCs with Metallic Interconnects, in Advances in Solid Oxide Fuel Cells IV: Ceramic Engineering and Science Proceedings, Volume 29, Issue 5 (eds P. Singh, N. P. Bansal, T. Ohji and A. Wereszczak), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470456309.ch9

Publication History

  1. Published Online: 1 APR 2009
  2. Published Print: 8 DEC 2008

ISBN Information

Print ISBN: 9780470344965

Online ISBN: 9780470456309

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Keywords:

  • degradation phenomena;
  • fuel gas;
  • cathodic contact layers;
  • auxiliary power unit;
  • anodic contacting

Summary

This chapter contains sections titled:

  • Abstract

  • Introduction

  • Stack Componecnts

  • Chromium Poisoning of ISM Cathode

  • Microstructural Investigation of PL and CCL

  • Summary

  • Acknowledgements

  • References