Electrical Characterization and Dielectric relaxation of Au/Porous Silicon Contacts

  1. K. M. Nair,
  2. D. Suvorov,
  3. R. W. Schwartz and
  4. R. Guo
  1. M. Chavarria and
  2. F. Fonthal

Published Online: 22 JUL 2009

DOI: 10.1002/9780470528990.ch13

Advances in Electroceramic Materials: Ceramic Transactions

Advances in Electroceramic Materials: Ceramic Transactions

How to Cite

Chavarria, M. and Fonthal, F. (2009) Electrical Characterization and Dielectric relaxation of Au/Porous Silicon Contacts, in Advances in Electroceramic Materials: Ceramic Transactions (eds K. M. Nair, D. Suvorov, R. W. Schwartz and R. Guo), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470528990.ch13

Publication History

  1. Published Online: 22 JUL 2009
  2. Published Print: 8 JUN 2009

ISBN Information

Print ISBN: 9780470408445

Online ISBN: 9780470528990

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Keywords:

  • porous silicon contacts;
  • dielectric relaxation;
  • electrical characterization;
  • electrochemical etching;
  • dielectric permittivity

Summary

This chapter contains sections titled:

  • Introduction

  • Experiments and Characterization

  • Results and Discussion

  • Conclusions

  • Acknowledgements