Chapter 2. Diffraction Analysis of Crystal Structure

  1. David Brandon Technion and
  2. Wayne D. Kaplan Technion

Published Online: 25 MAR 2008

DOI: 10.1002/9780470727133.ch2

Microstructural Characterization of Materials, 2nd Edition

Microstructural Characterization of Materials, 2nd Edition

How to Cite

Brandon, D. and Kaplan, W. D. (2008) Diffraction Analysis of Crystal Structure, in Microstructural Characterization of Materials, 2nd Edition, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470727133.ch2

Author Information

  1. Israel Institute of Technology, Israel

Publication History

  1. Published Online: 25 MAR 2008
  2. Published Print: 22 FEB 2008

ISBN Information

Print ISBN: 9780470027844

Online ISBN: 9780470727133

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Keywords:

  • diffraction spectrum and diffraction angles;
  • X-ray and electron beams;
  • neutron diffraction and interatomic spacing;
  • Body-centred or face-centred Bravais lattices;
  • face-centred reciprocal lattice;
  • limiting sphere and reflecting sphere;
  • temperature (thermal expansion);
  • alloying additions or applied stress;
  • X-ray data collection and processing systems;
  • monochromatic or white radiation;
  • chemical vapour deposition (CVD)

Summary

This chapter contains sections titled:

  • Scattering of Radiation by Crystals

  • Reciprocal Space

  • X-Ray Diffraction Methods

  • Diffraction Analysis

  • Electron Diffraction

  • Summary

  • Bibliography

  • Worked Examples

  • Problems