Chapter 4. Transmission Electron Microscopy

  1. David Brandon Technion and
  2. Wayne D. Kaplan Technion

Published Online: 25 MAR 2008

DOI: 10.1002/9780470727133.ch4

Microstructural Characterization of Materials, 2nd Edition

Microstructural Characterization of Materials, 2nd Edition

How to Cite

Brandon, D. and Kaplan, W. D. (2008) Transmission Electron Microscopy, in Microstructural Characterization of Materials, 2nd Edition, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470727133.ch4

Author Information

  1. Israel Institute of Technology, Israel

Publication History

  1. Published Online: 25 MAR 2008
  2. Published Print: 22 FEB 2008

ISBN Information

Print ISBN: 9780470027844

Online ISBN: 9780470727133

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Keywords:

  • transmission electron microscopes;
  • scanning electron microscopes;
  • Sub-micrometre resolution;
  • electron diffraction patterns;
  • electron beam current densities;
  • tungsten filament source;
  • charge-coupled devices (CCDs);
  • digital image processing and analysis;
  • Electrostatic and Electromagnetic Focusing;
  • Thick and Thin Electromagnetic Lenses

Summary

This chapter contains sections titled:

  • Basic Principles

  • Specimen Preparation

  • The Origin of Contrast

  • Kinematic Interpretation of Diffraction Contrast

  • Dynamic Diffraction and Absorption Effects

  • Lattice Imaging at High Resolution

  • Scanning Transmission Electron Microscopy

  • Summary

  • Bibliography

  • Worked Examples

  • Problems