Chapter 7. Scanning Probe Microscopy and Related Techniques

  1. David Brandon Technion and
  2. Wayne D. Kaplan Technion

Published Online: 25 MAR 2008

DOI: 10.1002/9780470727133.ch7

Microstructural Characterization of Materials, 2nd Edition

Microstructural Characterization of Materials, 2nd Edition

How to Cite

Brandon, D. and Kaplan, W. D. (2008) Scanning Probe Microscopy and Related Techniques, in Microstructural Characterization of Materials, 2nd Edition, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470727133.ch7

Author Information

  1. Israel Institute of Technology, Israel

Publication History

  1. Published Online: 25 MAR 2008
  2. Published Print: 22 FEB 2008

ISBN Information

Print ISBN: 9780470027844

Online ISBN: 9780470727133

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Keywords:

  • X-ray diffraction or high energy electrons;
  • crystal structure and chemical composition;
  • electromagnetic radiation or high energy electrons;
  • Surface Forces and Surface Morphology;
  • Interatomic forces and interatomic potentials;
  • long-range attractive force and short-range repulsive force balance;
  • contact region and non-contact region;
  • Surface Force Measurements;
  • steric hindrance and molecular forces;
  • chemistry and surface crystallography

Summary

This chapter contains sections titled:

  • Surface Forces and Surface Morphology

  • Scanning Probe Microscopes

  • Field-Ion Microscopy and Atom Probe Tomography

  • Summary

  • Bibliography

  • Problems