Chapter 9. Quantitative and Tomographic Analysis of Microstructure

  1. David Brandon Technion and
  2. Wayne D. Kaplan Technion

Published Online: 25 MAR 2008

DOI: 10.1002/9780470727133.ch9

Microstructural Characterization of Materials, 2nd Edition

Microstructural Characterization of Materials, 2nd Edition

How to Cite

Brandon, D. and Kaplan, W. D. (2008) Quantitative and Tomographic Analysis of Microstructure, in Microstructural Characterization of Materials, 2nd Edition, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470727133.ch9

Author Information

  1. Israel Institute of Technology, Israel

Publication History

  1. Published Online: 25 MAR 2008
  2. Published Print: 22 FEB 2008

ISBN Information

Print ISBN: 9780470027844

Online ISBN: 9780470727133

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Keywords:

  • atom probe tomography;
  • three-dimensional chemical and morphological information;
  • microstructural chemistry and microstructural morphology;
  • phase identification and structure determination;
  • image data processing and image data analysis;
  • elastic tensile modulus;
  • thin-film devices and ceramic-coated cutting tools;
  • electroplated components and chemical vapour deposited coatings;
  • macrostructural, mesostructural, microstructural and nanostructural;
  • focused ion beam (FIB) milling

Summary

This chapter contains sections titled:

  • Basic Stereological Concepts

  • Accessible and Inaccessible Parameters

  • Optimizing Accuracy

  • Automated Image Analysis

  • Tomography and Three-Dimensional Reconstruction

  • Summary

  • Bibliography

  • Worked Examples

  • Problems