Chapter 2. High-Speed Digital Devices

  1. Spartaco Caniggia1 and
  2. Francescaromana Maradei2

Published Online: 10 OCT 2008

DOI: 10.1002/9780470772874.ch2

Signal Integrity and Radiated Emission of High-Speed Digital Systems

Signal Integrity and Radiated Emission of High-Speed Digital Systems

How to Cite

Caniggia, S. and Maradei, F. (2008) High-Speed Digital Devices, in Signal Integrity and Radiated Emission of High-Speed Digital Systems, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470772874.ch2

Author Information

  1. 1

    Italtel (retired) and Expert of Comitato Elettrotecnico Italiano (CEI), Italy

  2. 2

    Sapienza University of Rome, Italy

Publication History

  1. Published Online: 10 OCT 2008
  2. Published Print: 14 NOV 2008

ISBN Information

Print ISBN: 9780470511664

Online ISBN: 9780470772874

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Keywords:

  • high-speed digital systems;
  • Transistor–Transistor Logic (TTL);
  • Complementary Metal Oxide Semiconductor (CMOS) logic;
  • Emitter-Coupled Logic (ECL);
  • ECL and positive power supply (PECL);
  • logic gate - gate delay and rise and fall times;
  • drivers - push-pull and current steering;
  • I/O Buffer Information Specification (IBIS);
  • behavioral I/O models and SPICE

Summary

This chapter contains sections titled:

  • Input/Output Static Characteristic

  • Dynamic Characteristics: Gate Delay and Rise and Fall Times

  • Driver and Receiver Modeling

  • I/O Buffer Information Specification (IBIS) Models

  • References