Chapter 8. Delta I-Noise

  1. Spartaco Caniggia1 and
  2. Francescaromana Maradei2

Published Online: 10 OCT 2008

DOI: 10.1002/9780470772874.ch8

Signal Integrity and Radiated Emission of High-Speed Digital Systems

Signal Integrity and Radiated Emission of High-Speed Digital Systems

How to Cite

Caniggia, S. and Maradei, F. (2008) Delta I-Noise, in Signal Integrity and Radiated Emission of High-Speed Digital Systems, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470772874.ch8

Author Information

  1. 1

    Italtel (retired) and Expert of Comitato Elettrotecnico Italiano (CEI), Italy

  2. 2

    Sapienza University of Rome, Italy

Publication History

  1. Published Online: 10 OCT 2008
  2. Published Print: 14 NOV 2008

ISBN Information

Print ISBN: 9780470511664

Online ISBN: 9780470772874

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Keywords:

  • ground and power bounce mechanisms;
  • LVT digital device load type;
  • low-to-high transition switching current paths;
  • Delta I-Noise;
  • PCB stack-up and parallel-plate capacitor;
  • filtering improvement and embedded capacitance;
  • Standard Buried Capacitance (SBC) Test Boards;
  • bounce mechanism and SPICE simulation and measurement

Summary

This chapter contains sections titled:

  • Switching Noise

  • Filtering Power Distribution

  • Ground Bounce

  • Crosstalk and Switching Noise

  • References