Chapter 6. X-ray and Electron Spectroscopy Studies of Oxide Semiconductors for Photoelectrochemical Hydrogen Production

  1. Lionel Vayssieres
  1. Clemens Heske1,
  2. Lothar Weinhardt2 and
  3. Marcus Bär3

Published Online: 2 MAR 2010

DOI: 10.1002/9780470823996.ch6

On Solar Hydrogen & Nanotechnology

On Solar Hydrogen & Nanotechnology

How to Cite

Heske, C., Weinhardt, L. and Bär, M. (2010) X-ray and Electron Spectroscopy Studies of Oxide Semiconductors for Photoelectrochemical Hydrogen Production, in On Solar Hydrogen & Nanotechnology (ed L. Vayssieres), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9780470823996.ch6

Editor Information

  1. National Institute for Materials Science, Japan

Author Information

  1. 1

    Department of Chemistry, University of Nevada, Las Vegas, USA

  2. 2

    Experimentelle Physik II, Universität Würzburg, Germany

  3. 3

    Helmholtz-Zentrum Berlin für Materialien und Energie, Berlin, Germany

Publication History

  1. Published Online: 2 MAR 2010
  2. Published Print: 4 JAN 2010

ISBN Information

Print ISBN: 9780470823972

Online ISBN: 9780470823996

SEARCH

Keywords:

  • Soft x-ray specotroscopy;
  • electron spectroscopy;
  • electronic structure;
  • chemical structure;
  • band gap;
  • stability;
  • photoelectron spectroscopy;
  • inverse photoemission;
  • x-ray emission spectroscopy;
  • x-ray absorption spectroscopy

Summary

In this chapter, we demonstrate how soft x-ray- and electron-based spectroscopic methods are a powerful and evolving “tool chest” to aid in the development of suitable materials for photoelectrochemical hydrogen production, particularly focusing on the electronic and chemical properties of surfaces, interfaces, and bulk materials.