76. Accelerated Testing of Electronics to Simulate Long-Term Worldwide Environments

  1. R. Winston Revie
  1. L. F. Garfias-Mesias1 and
  2. M. Reid2

Published Online: 19 APR 2011

DOI: 10.1002/9780470872864.ch76

Uhlig's Corrosion Handbook, Third Edition

Uhlig's Corrosion Handbook, Third Edition

How to Cite

Garfias-Mesias, L. F. and Reid, M. (2011) Accelerated Testing of Electronics to Simulate Long-Term Worldwide Environments, in Uhlig's Corrosion Handbook, Third Edition (ed R. W. Revie), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470872864.ch76

Editor Information

  1. CANMET Materials Technology Laboratory, Ottawa, Ontario, Canada

Author Information

  1. 1

    DNV Columbus, Inc., Dublin, Ohio, USA

  2. 2

    Stokes Research Institute, University of Limerick, Limerick, Ireland

Publication History

  1. Published Online: 19 APR 2011
  2. Published Print: 28 MAR 2011

ISBN Information

Print ISBN: 9780470080320

Online ISBN: 9780470872864

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Keywords:

  • accelerated testing of electronics simulating long-term worldwide environments - mixed flowing gas (MFG) testing, in North America and Europe;
  • corrosion of electronic equipment worldwide - cause of failure in electronic components and devices;
  • accelerated corrosion testing, worldwide corrosion of electronics - MFG-class III, reliable test accelerating environmental condition types

Summary

This chapter contains sections titled:

  • Introduction

  • Mixed flowing gas testing

  • Corrosion of electronic equipment worldwide

  • Accelerated corrosion testing to simulate worldwide corrosion of electronics

  • Summary

  • References