1. Basic Concepts

  1. Cecil L. Smith

Published Online: 16 AUG 2010

DOI: 10.1002/9780470925409.ch1

Basic Process Measurements

Basic Process Measurements

How to Cite

Smith, C. L. (2009) Basic Concepts, in Basic Process Measurements, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780470925409.ch1

Publication History

  1. Published Online: 16 AUG 2010
  2. Published Print: 22 MAY 2009

ISBN Information

Print ISBN: 9780470380246

Online ISBN: 9780470925409

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Keywords:

  • discrete measurement;
  • sampled measurement;
  • repeatability;
  • calibration;
  • current loop

Summary

This chapter contains sections titled:

  • Continuous vs. Discrete Measurement

  • Continuous vs. Sampled Measurement

  • In-Line, On-Line, and Off-Line

  • Signals and Resolution

  • Zero, Span, and Range

  • Turndown Ratio and Rangeability

  • Accuracy

  • Repeatability

  • Measurement Uncertainty

  • Measurement Decision Risk

  • Calibration

  • Measurement Device Components

  • Current Loop

  • Power Supply and Wiring

  • Serial Communications

  • Smart Transmitters

  • Environmental Issues

  • Explosive Atmospheres

  • Measurement Device Dynamics

  • Filtering and Smoothing