Application of secondary ion mass spectrometry (SIMS) technique on the durability of solid oxide fuel cell (SOFC) materials
Advances in Electrocatalysis, Materials, Diagnostics and Durability
Materials for high temperature fuel cells
Published Online: 15 DEC 2010
Copyright © John Wiley & Sons, Ltd. All rights reserved.
Handbook of Fuel Cells
How to Cite
Yamaji, K., Sakai, N., Kishimoto, H., Horita, T., Brito, M. E. and Yokokawa, H. 2010. Application of secondary ion mass spectrometry (SIMS) technique on the durability of solid oxide fuel cell (SOFC) materials. Handbook of Fuel Cells. .
- Published Online: 15 DEC 2010
In this article, we introduce secondary ion mass spectrometry (SIMS) technique as a powerful tool to analyze the trace of mass transport at the interface of solid oxide fuel cell (SOFC) components. SOFC consists of several complex oxides and metals that are considered to be more stable than other types of fuel cells. However in a long term operation, the mass transport that occurs on the surface and interfaces of SOFC components will severely affect the degradation of cell performance, even though the flux of mass transport was very small. SIMS has many disadvantages as an analysis apparatus; its advantages are very unique. By combining the conventional scanning electron microscopy and energy dispersive X-ray spectrometer (SEM/EDX) analyses, one can get more precise and new results for small concentration changes in the vicinity of surface and interfaces. The application of such combined analysis technique will be very important to investigate the degradation mechanism of SOFCs. In the following chapter, we show some examples of the SIMS application.
- secondary ions mass spectrometer;
- mass transport;
- depth profile;