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Application of secondary ion mass spectrometry (SIMS) technique on the durability of solid oxide fuel cell (SOFC) materials

Advances in Electrocatalysis, Materials, Diagnostics and Durability

Materials for high temperature fuel cells

Materials durability

  1. K. Yamaji,
  2. N. Sakai,
  3. H. Kishimoto,
  4. T. Horita,
  5. M. E. Brito,
  6. H. Yokokawa

Published Online: 15 DEC 2010

DOI: 10.1002/9780470974001.f500037

Handbook of Fuel Cells

Handbook of Fuel Cells

How to Cite

Yamaji, K., Sakai, N., Kishimoto, H., Horita, T., Brito, M. E. and Yokokawa, H. 2010. Application of secondary ion mass spectrometry (SIMS) technique on the durability of solid oxide fuel cell (SOFC) materials. Handbook of Fuel Cells. .

Author Information

  1. National Institute of Advanced Industrial Science and Technology (AIST), Ibaraki, Japan

Publication History

  1. Published Online: 15 DEC 2010

Abstract

In this article, we introduce secondary ion mass spectrometry (SIMS) technique as a powerful tool to analyze the trace of mass transport at the interface of solid oxide fuel cell (SOFC) components. SOFC consists of several complex oxides and metals that are considered to be more stable than other types of fuel cells. However in a long term operation, the mass transport that occurs on the surface and interfaces of SOFC components will severely affect the degradation of cell performance, even though the flux of mass transport was very small. SIMS has many disadvantages as an analysis apparatus; its advantages are very unique. By combining the conventional scanning electron microscopy and energy dispersive X-ray spectrometer (SEM/EDX) analyses, one can get more precise and new results for small concentration changes in the vicinity of surface and interfaces. The application of such combined analysis technique will be very important to investigate the degradation mechanism of SOFCs. In the following chapter, we show some examples of the SIMS application.

Keywords:

  • secondary ions mass spectrometer;
  • SIMS;
  • SOFC;
  • mass transport;
  • diffusion;
  • degradation;
  • depth profile;
  • imaging