Chapter 7. Defects and Yield Issues

  1. Richard K. Ulrich1 and
  2. Leonard W. Schaper2
  1. Richard K. Ulrich

Published Online: 23 FEB 2010

DOI: 10.1002/9780471722939.ch7

Integrated Passive Component Technology

Integrated Passive Component Technology

How to Cite

Ulrich, R. K. (2003) Defects and Yield Issues, in Integrated Passive Component Technology (eds R. K. Ulrich and L. W. Schaper), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9780471722939.ch7

Editor Information

  1. 1

    Department of Chemical Engineering, University of Arkansas, Fayetteville, Arkansas, USA

  2. 2

    Department of Electrical Engineering, University of Arkansas, Fayetteville, Arkansa, USA

Author Information

  1. Department of Chemical Engineering, University of Arkansas, Fayetteville, Arkansas, USA

Publication History

  1. Published Online: 23 FEB 2010
  2. Published Print: 16 JUN 2003

ISBN Information

Print ISBN: 9780471244318

Online ISBN: 9780471722939

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Keywords:

  • capacitor defects;
  • defect density;
  • board yield losses

Summary

This chapter contains sections titled:

  • Causes of Fatal Defects in Integrated Capacitors

  • Measurement of Defect Density

  • Defect Density and System Yield

  • Yield Enhancement Techniques for Capacitors

  • Conclusions

  • References