6. Technique Development and Probe Design for TOFD Method Application
Published Online: 2 JUL 2012
DOI: 10.1002/9781118104781.ch6
Copyright © 2012 the Institute of Electrical and Electronics Engineers, Inc.
Book Title

Ultrasonic Inspection Technology Development and Search Unit Design: Examples of Practical Applications
Additional Information
How to Cite
Brook, M. V. (2011) Technique Development and Probe Design for TOFD Method Application, in Ultrasonic Inspection Technology Development and Search Unit Design: Examples of Practical Applications, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118104781.ch6
Publication History
- Published Online: 2 JUL 2012
- Published Print: 18 NOV 2011
ISBN Information
Print ISBN: 9780470874349
Online ISBN: 9781118104781
- Summary
- Chapter
Keywords:
- TOFD application, technique development and probe design;
- TOFD techniques, for crack-like flaw detection and sizing;
- TOFD forward scattering technique, on flat/curved surfaces;
- curved surface test object probe calculation, axial crack sizing;
- TOFD back scattering design, tandem probes for refracted angles
Summary
This chapter contains sections titled:
Introduction to Techniques Based on Diffraction Phenomena
TOFD Forward Scattering Technique
Examples of Probe Calculation for Curved Surface Test Object Inspection
Probe Design for TOFD Back Scattering Technique
