3. Advanced Polarimetric Concepts

  1. Jakob van Zyl and
  2. Yunjin Kim

Published Online: 4 OCT 2011

DOI: 10.1002/9781118116104.ch3

Synthetic Aperture Radar Polarimetry

Synthetic Aperture Radar Polarimetry

How to Cite

van Zyl, J. and Kim, Y. (2011) Advanced Polarimetric Concepts, in Synthetic Aperture Radar Polarimetry, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118116104.ch3

Author Information

  1. Jet Propulsion Laboratory, California Institute of Technology, USA

Publication History

  1. Published Online: 4 OCT 2011
  2. Published Print: 28 OCT 2011

Book Series:

  1. JPL Space Science and Technology Series

Book Series Editors:

  1. Joseph H. Yuen

ISBN Information

Print ISBN: 9781118115114

Online ISBN: 9781118116104



  • polarimetric concepts;
  • polarimetric scattering;
  • image classification


This chapter contains sections titled:

  • Vector-Matrix Duality of Scatterer Representation

  • Eigenvalue- and Eigenvector-Based Polarimetric Parameters

  • Decomposition of Polarimetric Scattering

  • Image Classification

  • Polarimetric SAR Interferometry

  • Summary

  • References