28. Shave-Off Profiling as a Nanoscale 3-D Element Imaging Technique
- Hiroyuki Ohshima
Published Online: 31 JAN 2012
Copyright © 2012 John Wiley & Sons, Inc.
Electrical Phenomena at Interfaces and Biointerfaces: Fundamentals and Applications in Nano-, Bio-, and Environmental Sciences
How to Cite
Nojima, M. (2012) Shave-Off Profiling as a Nanoscale 3-D Element Imaging Technique, in Electrical Phenomena at Interfaces and Biointerfaces: Fundamentals and Applications in Nano-, Bio-, and Environmental Sciences (ed H. Ohshima), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118135440.ch28
Center for Colloid and Interface Science, Research Institute for Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan
- Published Online: 31 JAN 2012
- Published Print: 9 MAR 2012
Print ISBN: 9780470582558
Online ISBN: 9781118135440
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