Characterizing Residual Stresses in Monolithic Silicon-Carbide through the Use of Finite Element Analysis

  1. John Allison,
  2. Peter Collins and
  3. George Spanos
  1. Brian Munn and
  2. Keyu Li

Published Online: 7 SEP 2011

DOI: 10.1002/9781118147726.ch19

Proceedings of the 1st World Congress on Integrated Computational Materials Engineering (ICME)

Proceedings of the 1st World Congress on Integrated Computational Materials Engineering (ICME)

How to Cite

Munn, B. and Li, K. (2011) Characterizing Residual Stresses in Monolithic Silicon-Carbide through the Use of Finite Element Analysis, in Proceedings of the 1st World Congress on Integrated Computational Materials Engineering (ICME) (eds J. Allison, P. Collins and G. Spanos), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118147726.ch19

Publication History

  1. Published Online: 7 SEP 2011
  2. Published Print: 5 JUL 2011

ISBN Information

Print ISBN: 9780470943199

Online ISBN: 9781118147726

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