22. Measurements of Surface Contaminants and Sorbed Organics Using an Ion Trap Secondary Ion Mass Spectrometer

  1. Mike S. Lee
  1. Gary S. Groenewold,
  2. Anthony D. Appelhans,
  3. Garold L. Gresham and
  4. John E. Olson

Published Online: 21 MAY 2012

DOI: 10.1002/9781118180730.ch22

Mass Spectrometry Handbook

Mass Spectrometry Handbook

How to Cite

Groenewold, G. S., Appelhans, A. D., Gresham, G. L. and Olson, J. E. (2012) Measurements of Surface Contaminants and Sorbed Organics Using an Ion Trap Secondary Ion Mass Spectrometer, in Mass Spectrometry Handbook (ed M. S. Lee), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118180730.ch22

Editor Information

  1. Milestone Development Services, USA

Author Information

  1. Idaho National Laboratory, Interfacial Chemistry Department, Idaho Falls, ID, USA

Publication History

  1. Published Online: 21 MAY 2012
  2. Published Print: 18 APR 2012

Book Series:

  1. Wiley Series on Pharmaceutical Science and Biotechnology: Practices, Applications and Methods

Book Series Editors:

  1. Mike S. Lee

Series Editor Information

  1. Milestone Development Services, USA

ISBN Information

Print ISBN: 9780470536735

Online ISBN: 9781118180730

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Keywords:

  • surface contaminant measure using IT-SIMS;
  • IT-SIMS in direct surface, AMPAs, mustard, and IT-SIMS in DSIMS;
  • IT-SIMS, and control of surface charging;
  • blister agent analysis, IT–SIMS, in hydrolyzed CEES solution to soil

Summary

This chapter contains sections titled:

  • Introduction

  • Instrumental Description

  • Analysis of Alkyl Methylphosphonic Acids (AMPAS)

  • Analysis of Blister Agents

  • Analysis of Nerve Agents

  • Direct Sample Introduction Mass Spectrometry (DSIMS) Analysis of Surrogates in Contact with Permeable Materials

  • Conclusions and Prospects

  • Acknowledgment

  • References