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Appendix E: Test Methods

  1. Henry B. Garrett and
  2. Albert C. Whittlesey

Published Online: 4 MAY 2012

DOI: 10.1002/9781118241400.app5

Guide to Mitigating Spacecraft Charging Effects

Guide to Mitigating Spacecraft Charging Effects

How to Cite

Garrett, H. B. and Whittlesey, A. C. (2012) Appendix E: Test Methods, in Guide to Mitigating Spacecraft Charging Effects, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118241400.app5

Author Information

  1. Jet Propulsion Laboratory, California Institute of Technology, USA

Publication History

  1. Published Online: 4 MAY 2012
  2. Published Print: 4 MAY 2012

Book Series:

  1. JPL Space Science and Technology Series

Book Series Editors:

  1. Joseph H. Yuen

ISBN Information

Print ISBN: 9781118186459

Online ISBN: 9781118241400



This appendix contains sections titled:

  • Electron-Beam Tests

  • Dielectric Strength/Breakdown Voltage

  • Resistivity–Conductivity Determination

  • Simple Volume Resistivity Measurement

  • Electron-Beam Resistivity Test Method

  • NonContacting Voltmeter Resistivity Test Method

  • Dielectric Constant, Time Constant

  • Vzap Test [MIL-STD-883G, Method 3015.7 Human Body Model (HBM)]

  • Transient Susceptibility Tests

  • Component/Assembly Testing

  • Surface Charging ESD Test Environments

  • System Internal ESD Testing

  • References