10. Depth Profiling

  1. Milan Milosevic

Published Online: 22 APR 2012

DOI: 10.1002/9781118309742.ch10

Internal Reflection and ATR Spectroscopy

Internal Reflection and ATR Spectroscopy

How to Cite

Milosevic, M. (2012) Depth Profiling, in Internal Reflection and ATR Spectroscopy, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118309742.ch10

Author Information

  1. MeV Technologies LLC, Westport, Connecticut, USA

Publication History

  1. Published Online: 22 APR 2012
  2. Published Print: 1 JUN 2012

ISBN Information

Print ISBN: 9780470278321

Online ISBN: 9781118309742

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Keywords:

  • depth profiling, layer thickness and refractive index extraction;
  • absorption mechanism in ATR, depth profiling by ATR;
  • thin absorbing layer on nonabsorbing substrate;
  • nonabsorbing film of thickness

Summary

This chapter contains sections titled:

  • Energy Absorption at Different Depths

  • Thin Absorbing Layer on a Nonabsorbing Substrate

  • Thin Nonabsorbing Film on an Absorbing Substrate

  • Thin Nonabsorbing Film on a Thin Absorbing Film on a Nonabsorbing Substrate