Effects of Pulsed Magnetic Annealing on the Grain Boundary of Primary Recrystallized Microstructure in the Grain-Oriented Silicon Steel

  1. TMS
  1. Junjun Huang,
  2. Lihua Liu,
  3. Xin Xia,
  4. Xiang Jiang,
  5. Lijuan Li and
  6. Qijie Zhai

Published Online: 18 MAY 2012

DOI: 10.1002/9781118356074.ch26

Supplemental Proceedings: Materials Processing and Interfaces, Volume 1

Supplemental Proceedings: Materials Processing and Interfaces, Volume 1

How to Cite

Huang, J., Liu, L., Xia, X., Jiang, X., Li, L. and Zhai, Q. (2012) Effects of Pulsed Magnetic Annealing on the Grain Boundary of Primary Recrystallized Microstructure in the Grain-Oriented Silicon Steel, in Supplemental Proceedings: Materials Processing and Interfaces, Volume 1 (ed TMS), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118356074.ch26

Author Information

Publication History

  1. Published Online: 18 MAY 2012
  2. Published Print: 17 MAR 2012

ISBN Information

Print ISBN: 9781118296073

Online ISBN: 9781118356074

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Keywords:

  • Pulsed Magnetic Field;
  • Annealing;
  • Recrystallization and Grain Boundaries;
  • Grain Oriented Silicon Steel;
  • EBSD Technology

Summary

This chapter contains sections titled:

  • Introduction

  • Experimental Procedures

  • Results and Discussion

  • Conclusions

  • Acknowledgments