Evaluating Superconducting Ybco Film Properties Using Xray Photoelectron Spectroscopy

  1. Ruling Meng4,
  2. Amit Goyal5,
  3. Winnie Wong-Ng6,
  4. Kaname Matsumoto7 and
  5. Herbert C. Freyhardt8
  1. Paul N. Barnes1,
  2. Justin C. Tolliver1,
  3. Timothy J. Haugan1,
  4. Sharmila M. Mukhopadhyay2 and
  5. John T. Grant3

Published Online: 25 APR 2012

DOI: 10.1002/9781118406106.ch4

Fabrication of Long-Length and Bulk High-Temperature Superconductors, Volume 149

Fabrication of Long-Length and Bulk High-Temperature Superconductors, Volume 149

How to Cite

Barnes, P. N., Tolliver, J. C., Haugan, T. J., Mukhopadhyay, S. M. and Grant, J. T. (2006) Evaluating Superconducting Ybco Film Properties Using Xray Photoelectron Spectroscopy, in Fabrication of Long-Length and Bulk High-Temperature Superconductors, Volume 149 (eds R. Meng, A. Goyal, W. Wong-Ng, K. Matsumoto and H. C. Freyhardt), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118406106.ch4

Editor Information

  1. 4

    University of Houston

  2. 5

    Oak Ridge National Laboratory

  3. 6

    National Institute of Standards and Technology

  4. 7

    Kyoto University.

  5. 8

    Institut fur Matellphysik, Universitat Gottingen

Author Information

  1. 1

    Air Force Research Laboratory, AFRL/PRPG, Building 450, Wright-Patterson AFB, OH 45433

  2. 2

    Wright State University, Russ Engineering Center, Dayton, OH 45435

  3. 3

    University of Dayton, 300 College Park, Dayton, OH 45469

Publication History

  1. Published Online: 25 APR 2012
  2. Published Print: 1 MAR 2006

ISBN Information

Print ISBN: 9781574982046

Online ISBN: 9781118406106

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