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Optical Methods for the Measurement of Thermal Conductivity

Part IV. Materials Properties and Testing

  1. Prabhakar R. Bandaru,
  2. Max S. Aubain

Published Online: 16 NOV 2013

DOI: 10.1002/9781118436707.hmse036

Handbook of Measurement in Science and Engineering

Handbook of Measurement in Science and Engineering

How to Cite

Bandaru, P. R. and Aubain, M. S. 2013. Optical Methods for the Measurement of Thermal Conductivity. Handbook of Measurement in Science and Engineering. IV:36:1189–1212.

Author Information

  1. University of California—San Diego, La Jolla, CA, USA

Publication History

  1. Published Online: 16 NOV 2013

Abstract

To mitigate the issues associated with conventional methodologies for thermal conductivity measurements, such as those related to contact or thermal boundary resistance, noncontact, optical methods provide an alternate measurement technique. In this article, we briefly review the history of such optical methods and explain the principles involved in the thermoreflectance techniques as applied to silicon thin films.

Keywords:

  • anisotropy;
  • in-plane measurements;
  • nanoscale;
  • phonon dispersion;
  • thermal conductivity;
  • thermoreflectance;
  • thin films;
  • silicon