Thirteen. Remote Sensing of Impact Craters

  1. Gordon R. Osinski4 and
  2. Elisabetta Pierazzo5
  1. Shawn P. Wright1,
  2. Livio L. Tornabene2,4 and
  3. Michael S. Ramsey3

Published Online: 25 OCT 2012

DOI: 10.1002/9781118447307.ch13

Impact Cratering: Processes and Products

Impact Cratering: Processes and Products

How to Cite

Wright, S. P., Tornabene, L. L. and Ramsey, M. S. (2012) Remote Sensing of Impact Craters, in Impact Cratering: Processes and Products (eds G. R. Osinski and E. Pierazzo), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781118447307.ch13

Editor Information

  1. 4

    Departments of Earth Sciences/Physics and Astronomy, Western University, 1151 Richmond Street, London, ON, N6A 5B7, Canada

  2. 5

    Planetary Science Institute, 1700 E. Fort Lowell Road, Suite 106, Tucson, AZ 85719, USA

Author Information

  1. 1

    Institute of Meteoritics and Department of Earth and Planetary Sciences MSC03 2050, University of New Mexico, Albuquerque, NM 87131, USA

  2. 2

    Centre for Planetary Science and Exploration, Departments of Earth Sciences Western University, 1151 Richmond Street, London, ON, N6A 5B7, Canada

  3. 3

    Department of Geology and Planetary Science, University of Pittsburgh, 4107 O'Hara Street, SRCC, Pittsburgh, PA 15260-3332, USA

  4. 4

    Departments of Earth Sciences/Physics and Astronomy, Western University, 1151 Richmond Street, London, ON, N6A 5B7, Canada

Publication History

  1. Published Online: 25 OCT 2012
  2. Published Print: 30 NOV 2012

ISBN Information

Print ISBN: 9781405198295

Online ISBN: 9781118447307

SEARCH

Options for accessing this content:

  • If you have access to this content through a society membership, please first log in to your society website.
  • Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
  • You can purchase online access to this Chapter for a 24-hour period (price varies by title)
    • If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
    • New Users: Please register, then proceed to purchase the article.

Type your institution's name in the box below. If your institution is a Wiley customer, it will appear in the list of suggested institutions and you will be able to log in to access content. Some users may also log in directly via OpenAthens.

Please note that there are currently a number of duplicate entries in the list of institutions. We are actively working on fixing this issue and apologize for any inconvenience caused.

Please register to:

  • Save publications, articles and searches
  • Get email alerts
  • Get all the benefits mentioned below!

Register now >