High Resolution Electron Microscopy Study on Oxide Films Formed on Nickel-Base Alloys X-750, 182 and 82 in Simulated High Flow Velocity BWR Water Conditions

  1. Jeremy T. Busby,
  2. Gabriel Ilevbare and
  3. Peter L. Andresen
  1. Jiaxin Chen1,
  2. Fredrik Lindberg2,
  3. Lyubov Belova3,
  4. Björn Forssgren4,
  5. Karen Gott5,
  6. Johan Lejon6 and
  7. Audrius Jasiulevicius7

Published Online: 26 JUN 2012

DOI: 10.1002/9781118456835.ch36

15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems-Water Reactors

15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems-Water Reactors

How to Cite

Chen, J., Lindberg, F., Belova, L., Forssgren, B., Gott, K., Lejon, J. and Jasiulevicius, A. (2012) High Resolution Electron Microscopy Study on Oxide Films Formed on Nickel-Base Alloys X-750, 182 and 82 in Simulated High Flow Velocity BWR Water Conditions, in 15th International Conference on Environmental Degradation of Materials in Nuclear Power Systems-Water Reactors (eds J. T. Busby, G. Ilevbare and P. L. Andresen), John Wiley & Sons, Inc., Hoboken, New Jersey, Canada. doi: 10.1002/9781118456835.ch36

Author Information

  1. 1

    Studsvik Nuclear AB, SE-611 82, Nyköping, Sweden

  2. 2

    Swerea KIMAB AB, SE-102 16 Stockholm, Sweden

  3. 3

    Royal Institute of Technology, SE-100 44 Stockholm, Sweden

  4. 4

    Ringhals AB, SE-430 22 Väröbacka, Sweden

  5. 5

    Swedish Radiation Safety Authority, SE-171 16 Stockholm, Sweden

  6. 6

    OKG Aktiebolag, SE-572 83 Oskarshamn, Sweden

  7. 7

    Vattenfall Nuclear Fuel AB, SE-162 87 Stockholm, Sweden

Publication History

  1. Published Online: 26 JUN 2012
  2. Published Print: 2 APR 2012

ISBN Information

Print ISBN: 9781118132418

Online ISBN: 9781118456835

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