Application of Microelectrochemical Methods for Understanding Localized Corrosion Behavior of Aluminum Alloys

  1. Hasso Weiland,
  2. Anthony D. Rollett and
  3. William A. Cassada
  1. R.G. Buchheit1 and
  2. N. Birbilis2

Published Online: 4 SEP 2012

DOI: 10.1002/9781118495292.ch54

ICAA13: 13th International Conference on Aluminum Alloys

ICAA13: 13th International Conference on Aluminum Alloys

How to Cite

Buchheit, R.G. and Birbilis, N. (2012) Application of Microelectrochemical Methods for Understanding Localized Corrosion Behavior of Aluminum Alloys, in ICAA13: 13th International Conference on Aluminum Alloys (eds H. Weiland, A. D. Rollett and W. A. Cassada), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118495292.ch54

Author Information

  1. 1

    Fontana Corrosion Center, Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio USA

  2. 2

    Dept. of Materials Engineering, Monash University, Clayton, Victoria, Australia

Publication History

  1. Published Online: 4 SEP 2012
  2. Published Print: 5 JUN 2012

ISBN Information

Print ISBN: 9781118458044

Online ISBN: 9781118495292

SEARCH

Options for accessing this content:

  • If you are a society or association member and require assistance with obtaining online access instructions please contact our Journal Customer Services team.
    http://wiley.force.com/Interface/ContactJournalCustomerServices_V2.
  • Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
  • You can purchase online access to this Chapter for a 24-hour period (price varies by title)
    • If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
    • New Users: Please register, then proceed to purchase the article.

Login via OpenAthens

or

Search for your institution's name below to login via Shibboleth.

Please register to:

  • Save publications, articles and searches
  • Get email alerts
  • Get all the benefits mentioned below!

Register now >