Evolution of Microstructure Due to Additives and Processing

  1. K. M. Nair and
  2. Shashank Priya
  1. N. B. Singh,
  2. A. Berghmans,
  3. D. Knuteson,
  4. J. Talvacchio,
  5. D. Kahler,
  6. M. House,
  7. B. Schreib,
  8. B. Wagner and
  9. M. King

Published Online: 7 NOV 2012

DOI: 10.1002/9781118511350.ch7

Advances and Applications in Electroceramics II: Ceramic Transactions, Volume 235

Advances and Applications in Electroceramics II: Ceramic Transactions, Volume 235

How to Cite

Singh, N. B., Berghmans, A., Knuteson, D., Talvacchio, J., Kahler, D., House, M., Schreib, B., Wagner, B. and King, M. (2012) Evolution of Microstructure Due to Additives and Processing, in Advances and Applications in Electroceramics II: Ceramic Transactions, Volume 235 (eds K. M. Nair and S. Priya), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118511350.ch7

Publication History

  1. Published Online: 7 NOV 2012
  2. Published Print: 15 OCT 2012

ISBN Information

Print ISBN: 9781118273357

Online ISBN: 9781118511350

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Keywords:

  • calcium oxide;
  • dielectric constant;
  • stoichiometric ccto materials;
  • dielectric constant;
  • leakage current measurements

Summary

This chapter contains sections titled:

  • Introduction

  • Experimental Methods

  • Results and Discussion

  • Summary