8. More Recent Trends in X-Ray Fluorescence Instrumentation

  1. Ron Jenkins

Published Online: 4 SEP 2012

DOI: 10.1002/9781118521014.ch8

X-Ray Fluorescence Spectrometry, Volume 152, Second Edition

X-Ray Fluorescence Spectrometry, Volume 152, Second Edition

How to Cite

Jenkins, R. (1999) More Recent Trends in X-Ray Fluorescence Instrumentation, in X-Ray Fluorescence Spectrometry, Volume 152, Second Edition, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118521014.ch8

Publication History

  1. Published Online: 4 SEP 2012
  2. Published Print: 4 JUN 1999

ISBN Information

Print ISBN: 9780471299424

Online ISBN: 9781118521014

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Keywords:

  • X-ray fluorescence instrumentation;
  • low atomic number elements;
  • total reflection X-ray fluorescence;
  • synchrotron source x-ray fluorescence;
  • proton induced X-ray fluorescence

Summary

This chapter contains sections titled:

  • The Role of X-Ray Fluorescence in Industry and Research

  • Scope of the X-Ray Fluorescence Method

  • The Determination of Low Atomic Number Elements

  • Total Reflection X-Ray Fluorescence

  • Synchrotron Source X-Ray Fluorescence—SSXRF

  • Proton Induced X-Ray Fluorescence