8. More Recent Trends in X-Ray Fluorescence Instrumentation
Published Online: 4 SEP 2012
DOI: 10.1002/9781118521014.ch8
Copyright © 1999 John Wiley & Sons, Inc.
Book Title

X-Ray Fluorescence Spectrometry, Volume 152, Second Edition
Additional Information
How to Cite
Jenkins, R. (1999) More Recent Trends in X-Ray Fluorescence Instrumentation, in X-Ray Fluorescence Spectrometry, Volume 152, Second Edition, John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118521014.ch8
Publication History
- Published Online: 4 SEP 2012
- Published Print: 4 JUN 1999
ISBN Information
Print ISBN: 9780471299424
Online ISBN: 9781118521014
- Summary
- Chapter
- References
Keywords:
- X-ray fluorescence instrumentation;
- low atomic number elements;
- total reflection X-ray fluorescence;
- synchrotron source x-ray fluorescence;
- proton induced X-ray fluorescence
Summary
This chapter contains sections titled:
-
The Role of X-Ray Fluorescence in Industry and Research
-
Scope of the X-Ray Fluorescence Method
-
The Determination of Low Atomic Number Elements
-
Total Reflection X-Ray Fluorescence
-
Synchrotron Source X-Ray Fluorescence—SSXRF
-
Proton Induced X-Ray Fluorescence
