2. Nanoparticle Characterization Using Central X-Ray Diffraction

  1. Philippe Goudeau2 and
  2. René Guinebretière3
  1. Olivier Spalla

Published Online: 21 JAN 2013

DOI: 10.1002/9781118562888.ch2

X-Rays and Materials

X-Rays and Materials

How to Cite

Spalla, O. (2012) Nanoparticle Characterization Using Central X-Ray Diffraction, in X-Rays and Materials (eds P. Goudeau and R. Guinebretière), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118562888.ch2

Editor Information

  1. 2

    Institut Pprime-CNRS, University of Poitiers, ENSMA, SP2MI, Futuroscope Chasseneuil, France

  2. 3

    Laboratoire SPCTS-CNRS, Ecole nationale supérieure, de céramique industrielle, ENSCI, Limoges, France

Author Information

  1. LIONS, CEA/CNRS, Commissariat à l'énergie, atomique, Saclay, Gif-sur-Yvette, France

Publication History

  1. Published Online: 21 JAN 2013
  2. Published Print: 1 MAR 2012

ISBN Information

Print ISBN: 9781848213425

Online ISBN: 9781118562888

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Keywords:

  • scattered intensity;
  • particle-based;
  • Guinier regime;
  • polyhedral particles;
  • absolute scale

Summary

This chapter contains sections titled:

  • Introduction

  • Definition of scattered intensity

  • Invariance principle

  • Behavior for large q: the Porod regime

  • Particle-based systems

  • An absolute scale for measuring particle numbers

  • Conclusion

  • Bibliography