An Automated Multi-Modal Serial Sectioning System for Characterization of Grain-Scale Microstructures in Engineering Materials

  1. Marc De Graef,
  2. Henning Friis Poulsen,
  3. Alexis Lewis,
  4. Jeff Simmons and
  5. George Spanos
  1. Michael Uchic1,
  2. Michael Groeber1,
  3. Megna Shah2,
  4. Patrick Callahan1,3,
  5. Adam Shiveley4,
  6. Michael Scott2,
  7. Michael Chapman4 and
  8. Jonathan Spowart1

Published Online: 8 MAY 2013

DOI: 10.1002/9781118686768.ch30

1 International Conference on 3D Materials Science

1 International Conference on 3D Materials Science

How to Cite

Uchic, M., Groeber, M., Shah, M., Callahan, P., Shiveley, A., Scott, M., Chapman, M. and Spowart, J. (2012) An Automated Multi-Modal Serial Sectioning System for Characterization of Grain-Scale Microstructures in Engineering Materials, in 1 International Conference on 3D Materials Science (eds M. De Graef, H. F. Poulsen, A. Lewis, J. Simmons and G. Spanos), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118686768.ch30

Author Information

  1. 1

    Air Force Research Laboratory, Materials & Manufacturing Directorate, Wright-Patterson AFB, OH 45433

  2. 2

    UES, Inc, Dayton, OH 45432

  3. 3

    Carnegie Mellon University, Department of Materials Science and Engineering, Pittsburgh, PA, 15213

  4. 4

    SOCHE, Dayton, OH 45433

Publication History

  1. Published Online: 8 MAY 2013
  2. Published Print: 29 JUN 2012

ISBN Information

Print ISBN: 9781118470398

Online ISBN: 9781118686768

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