3. Physical Characterisation of Photovoltaic Materials

  1. Gavin Conibeer3 and
  2. Arthur Willoughby4
  1. Daniel Bellet1 and
  2. Edith Bellet-Amalric2

Published Online: 17 JAN 2014

DOI: 10.1002/9781118695784.ch3

Solar Cell Materials: Developing Technologies

Solar Cell Materials: Developing Technologies

How to Cite

Bellet, D. and Bellet-Amalric, E. (2014) Physical Characterisation of Photovoltaic Materials, in Solar Cell Materials: Developing Technologies (eds G. Conibeer and A. Willoughby), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781118695784.ch3

Editor Information

  1. 3

    School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Australia

  2. 4

    Emeritus Professor, Engineering Materials Research Group, Faculty of Engineering and the Environment, Southampton University, UK

Author Information

  1. 1

    Laboratorie des Matériaux et du Génie Physique, CNRS, France

  2. 2

    CEA-CNRS-UJF group ‘Nanophysique et Semiconducteurs’, CEA/INAC/SP2M, France

Publication History

  1. Published Online: 17 JAN 2014
  2. Published Print: 16 JAN 2014

ISBN Information

Print ISBN: 9780470065518

Online ISBN: 9781118695784

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Keywords:

  • electron backscattering diffraction (EBSD);
  • grazing-incidence X-ray diffraction (GIXRD);
  • photovoltaic materials;
  • Rutherford backscattering spectrometry (RBS);
  • scanning electron microscopy (SEM);
  • secondary ion mass spectrometry (SIMS);
  • X-Ray diffraction (XRD);
  • X-Ray photoelectron spectroscopy (XPS);
  • X-Ray reflectivity (XRR)

Summary

This chapter contains sections titled:

  • This chapter provides an introductory and short summary related to some material characterisation techniques of particular interest in solar cell science. At first, some general remarks dealing with the correspondence between photovoltaic materials characterisation needs and physical techniques are briefly presented. Then, three separate sections deal with specific characterisation techniques: X-ray, electron microscopy and spectroscopic methods. X-ray diffraction (XRD), grazing-incidence X-ray diffraction (GIXRD) and X-ray reflectivity (XRR) are explained under the section X-ray techniques. Scanning electron microscopy (SEM), electron backscattering diffraction (EBSD) and other methods are described under electron microscopic methods. X-ray photoelectron spectroscopy (XPS), secondary ion mass spectrometry (SIMS) and Rutherford backscattering spectrometry (RBS) are covered under spectroscopic techniques.