Full-Field Multi-Scale Modelling of Sheet Metal Forming Taking the Evolution of Texture and Plastic Anisotropy into Account

  1. Mei Li,
  2. Carelyn Campbell,
  3. Katsuyo Thornton,
  4. Elizabeth Holm and
  5. Peter Gumbsch
  1. Paul Van Houtte1,
  2. Jerzy Gawad2,
  3. Philip Eyckens1,
  4. Albert Van Bael1,
  5. Giovanni Samaey2 and
  6. Dirk Roose2

Published Online: 12 JUL 2013

DOI: 10.1002/9781118767061.ch34

2 World Congress on Integrated Computational Materials Engineering

2 World Congress on Integrated Computational Materials Engineering

How to Cite

Van Houtte, P., Gawad, J., Eyckens, P., Van Bael, A., Samaey, G. and Roose, D. (2013) Full-Field Multi-Scale Modelling of Sheet Metal Forming Taking the Evolution of Texture and Plastic Anisotropy into Account, in 2 World Congress on Integrated Computational Materials Engineering (eds M. Li, C. Campbell, K. Thornton, E. Holm and P. Gumbsch), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118767061.ch34

Author Information

  1. 1

    Department MTM, KULeuven, Kasteelpark Arenberg 44, 3001 Leuven, Belgium

  2. 2

    Department of Computer Science, KULeuven, Celestijnenlaan 200 A, 3001 Leuven, Belgium

Publication History

  1. Published Online: 12 JUL 2013
  2. Published Print: 21 JUN 2013

ISBN Information

Print ISBN: 9781118766897

Online ISBN: 9781118767061

SEARCH

Options for accessing this content:

  • If you have access to this content through a society membership, please first log in to your society website.
  • Login via other institutional login options http://onlinelibrary.wiley.com/login-options.
  • You can purchase online access to this Chapter for a 24-hour period (price varies by title)
    • If you already have a Wiley Online Library or Wiley InterScience user account: login above and proceed to purchase the article.
    • New Users: Please register, then proceed to purchase the article.

Type your institution's name in the box below. If your institution is a Wiley customer, it will appear in the list of suggested institutions and you will be able to log in to access content. Some users may also log in directly via OpenAthens.

Please note that there are currently a number of duplicate entries in the list of institutions. We are actively working on fixing this issue and apologize for any inconvenience caused.

Please register to:

  • Save publications, articles and searches
  • Get email alerts
  • Get all the benefits mentioned below!

Register now >