Building 3D Microstructure Database Using an Advanced Metallographic Serial Sectioning Technique and Robust 3D Segmentation Tools

  1. Mei Li,
  2. Carelyn Campbell,
  3. Katsuyo Thornton,
  4. Elizabeth Holm and
  5. Peter Gumbsch
  1. Umesh Adiga,
  2. Murali Gorantla,
  3. James Scott,
  4. Daniel Banks and
  5. Yoon-Suk Choi

Published Online: 12 JUL 2013

DOI: 10.1002/9781118767061.ch39

2 World Congress on Integrated Computational Materials Engineering

2 World Congress on Integrated Computational Materials Engineering

How to Cite

Adiga, U., Gorantla, M., Scott, J., Banks, D. and Choi, Y.-S. (2013) Building 3D Microstructure Database Using an Advanced Metallographic Serial Sectioning Technique and Robust 3D Segmentation Tools, in 2 World Congress on Integrated Computational Materials Engineering (eds M. Li, C. Campbell, K. Thornton, E. Holm and P. Gumbsch), John Wiley & Sons, Inc., Hoboken, NJ, USA. doi: 10.1002/9781118767061.ch39

Publication History

  1. Published Online: 12 JUL 2013
  2. Published Print: 21 JUN 2013

ISBN Information

Print ISBN: 9781118766897

Online ISBN: 9781118767061

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Keywords:

  • gray level intensity;
  • 3D technology;
  • R3Danalytics

Summary

This chapter contains sections titled:

  • Introduction

  • Image Analysis

  • Experimental Results and Discussions