18. Influence of Miniaturization on Mechanical Reliability of Lead-Free Solder Interconnects

  1. K. N. Subramanian
  1. Golta Khatibi1,
  2. Herbert Ipser2,
  3. Martin Lederer1,
  4. Brigitte Weiss1

Published Online: 15 MAR 2012

DOI: 10.1002/9781119966203.ch18

Lead-Free Solders: Materials Reliability for Electronics

Lead-Free Solders: Materials Reliability for Electronics

How to Cite

Khatibi, G., Ipser, H., Lederer, M. and Weiss, B. (2012) Influence of Miniaturization on Mechanical Reliability of Lead-Free Solder Interconnects, in Lead-Free Solders: Materials Reliability for Electronics (ed K. N. Subramanian), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119966203.ch18

Editor Information

  1. Department of Chemical Engineering and Materials Science, Michigan State University, Michigan, USA

Author Information

  1. 1

    University of Vienna, Physics of Nanostructured Materials, Boltzmanngasse 5, Vienna A-1090, Austria

  2. 2

    University of Vienna, Department of Inorganic Chemistry/Materials Chemistry, Waehringerstr. 42, Vienna A-1090, Austria

Publication History

  1. Published Online: 15 MAR 2012
  2. Published Print: 6 MAR 2012

Book Series:

  1. Wiley Series in Materials for Electronic and Optoelectronic Applications

Book Series Editors:

  1. Arthur Willoughby4,
  2. Peter Capper5,
  3. Safa Kasap6

Series Editor Information

  1. 4

    University of Southampton, Southampton, UK

  2. 5

    SELEX Galileo Infrared Ltd., Southampton, UK

  3. 6

    University of Saskatchewan, Canada

ISBN Information

Print ISBN: 9780470971826

Online ISBN: 9781119966203

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Keywords:

  • lead-free reliability;
  • miniaturization;
  • solder joint, integrity;
  • solder alloy reliability;
  • miniaturization;
  • tensile and shear;
  • IMC, fracture morphology;
  • constraints and effects

Summary

This chapter contains sections titled:

  • Introduction

  • Effect of Miniaturization on Static Properties of Solder Joints (Tensile and Shear)

  • Creep and Relaxation of Solder Joints

  • Summary and Conclusions

  • Acknowledgments

  • References