1. General Introduction to Transmission Electron Microscopy (TEM)
- Rik Brydson
Published Online: 26 JUL 2011
DOI: 10.1002/9781119978848.ch1
Copyright © 2011 John Wiley & Sons, Ltd
Book Title
Aberration-Corrected Analytical Transmission Electron Microscopy
Additional Information
How to Cite
Goodhew, P. (2011) General Introduction to Transmission Electron Microscopy (TEM), in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch1
Editor Information
Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK
Publication History
- Published Online: 26 JUL 2011
- Published Print: 16 SEP 2011
ISBN Information
Print ISBN: 9780470518519
Online ISBN: 9781119978848
- Summary
- Chapter
- References
Keywords:
- Transmission Electron Microscopy (TEM) - sub-micrometre, internal fine structure in solids;
- TEM, and two types - CTEM and STEM, differing principally in the way they address specimen;
- scanning TEM (STEM) - deploying a fine focused beam;
- aberration correction, in principle - application in any magnetic lens, in any microscope;
- STEM, with a condenser system - better called as a probe-forming lens;
- aberration correction in STEM;
- conventional TEM (CTEM), wide-beam technique - electron beam flooding image;
- image computing - and image processing, artefacts in ‘black box’ processing;
- image simulation - input of a large number of pieces of information;
- specimen, suitability for TEM study - being thin enough, for electron transmission
Summary
This chapter contains sections titled:
What TEM Offers
Electron Scattering
Signals which could be Collected
Image Computing
Requirements of a Specimen
STEM Versus CTEM
Two Dimensional and Three Dimensional Information
References