1. General Introduction to Transmission Electron Microscopy (TEM)

  1. Rik Brydson
  1. Peter Goodhew

Published Online: 26 JUL 2011

DOI: 10.1002/9781119978848.ch1

Aberration-Corrected Analytical Transmission Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy

How to Cite

Goodhew, P. (2011) General Introduction to Transmission Electron Microscopy (TEM), in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch1

Editor Information

  1. Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK

Author Information

  1. School of Engineering, University of Liverpool, Liverpool, UK

Publication History

  1. Published Online: 26 JUL 2011
  2. Published Print: 16 SEP 2011

Book Series:

  1. RMS-Wiley Imprint

Book Series Editors:

  1. Susan Brooks

ISBN Information

Print ISBN: 9780470518519

Online ISBN: 9781119978848

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Keywords:

  • Transmission Electron Microscopy (TEM) - sub-micrometre, internal fine structure in solids;
  • TEM, and two types - CTEM and STEM, differing principally in the way they address specimen;
  • scanning TEM (STEM) - deploying a fine focused beam;
  • aberration correction, in principle - application in any magnetic lens, in any microscope;
  • STEM, with a condenser system - better called as a probe-forming lens;
  • aberration correction in STEM;
  • conventional TEM (CTEM), wide-beam technique - electron beam flooding image;
  • image computing - and image processing, artefacts in ‘black box’ processing;
  • image simulation - input of a large number of pieces of information;
  • specimen, suitability for TEM study - being thin enough, for electron transmission

Summary

This chapter contains sections titled:

  • What TEM Offers

  • Electron Scattering

  • Signals which could be Collected

  • Image Computing

  • Requirements of a Specimen

  • STEM Versus CTEM

  • Two Dimensional and Three Dimensional Information

  • References