2. Introduction to Electron Optics
- Rik Brydson
Published Online: 26 JUL 2011
DOI: 10.1002/9781119978848.ch2
Copyright © 2011 John Wiley & Sons, Ltd
Book Title
Aberration-Corrected Analytical Transmission Electron Microscopy
Additional Information
How to Cite
Tatlock, G. (2011) Introduction to Electron Optics, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch2
Editor Information
Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK
Publication History
- Published Online: 26 JUL 2011
- Published Print: 16 SEP 2011
ISBN Information
Print ISBN: 9780470518519
Online ISBN: 9781119978848
- Summary
- Chapter
- References
Keywords:
- electron optics;
- revision of microscopy - with visible light and electrons;
- Fresnel and Fraunhofer diffraction - Fresnel integral, using amplitude-phase diagram;
- image resolution - diffraction effects, image formed by aberration-free convergent lens;
- solutions of integral over lens and/or aperture - and Bessel function;
- Rayleigh criterion;
- electron lenses, electrostatic and electromagnetic lenses - in electron microscopes;
- electron sources - choice, depending on beam current and energy spread;
- thermionic electron gun;
- probe forming systems, with multiple lens condenser system - probe size and convergence angle, varying independently
Summary
This chapter contains sections titled:
Revision of Microscopy with Visible Light and Electrons
Fresnel and Fraunhofer Diffraction
Image Resolution
Electron Lenses
Electron Sources
Probe Forming Optics and Apertures
SEM, TEM and STEM
References