2. Introduction to Electron Optics

  1. Rik Brydson
  1. Gordon Tatlock

Published Online: 26 JUL 2011

DOI: 10.1002/9781119978848.ch2

Aberration-Corrected Analytical Transmission Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy

How to Cite

Tatlock, G. (2011) Introduction to Electron Optics, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch2

Editor Information

  1. Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK

Author Information

  1. School of Engineering, University of Liverpool, Liverpool, UK

Publication History

  1. Published Online: 26 JUL 2011
  2. Published Print: 16 SEP 2011

Book Series:

  1. RMS-Wiley Imprint

Book Series Editors:

  1. Susan Brooks

ISBN Information

Print ISBN: 9780470518519

Online ISBN: 9781119978848



  • electron optics;
  • revision of microscopy - with visible light and electrons;
  • Fresnel and Fraunhofer diffraction - Fresnel integral, using amplitude-phase diagram;
  • image resolution - diffraction effects, image formed by aberration-free convergent lens;
  • solutions of integral over lens and/or aperture - and Bessel function;
  • Rayleigh criterion;
  • electron lenses, electrostatic and electromagnetic lenses - in electron microscopes;
  • electron sources - choice, depending on beam current and energy spread;
  • thermionic electron gun;
  • probe forming systems, with multiple lens condenser system - probe size and convergence angle, varying independently


This chapter contains sections titled:

  • Revision of Microscopy with Visible Light and Electrons

  • Fresnel and Fraunhofer Diffraction

  • Image Resolution

  • Electron Lenses

  • Electron Sources

  • Probe Forming Optics and Apertures

  • SEM, TEM and STEM

  • References