5. Theory and Simulations of STEM Imaging

  1. Rik Brydson
  1. Peter D. Nellist

Published Online: 26 JUL 2011

DOI: 10.1002/9781119978848.ch5

Aberration-Corrected Analytical Transmission Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy

How to Cite

Nellist, P. D. (2011) Theory and Simulations of STEM Imaging, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch5

Editor Information

  1. Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK

Author Information

  1. Department of Materials, Corpus Christi College, University of Oxford, Oxford, UK

Publication History

  1. Published Online: 26 JUL 2011
  2. Published Print: 16 SEP 2011

Book Series:

  1. RMS-Wiley Imprint

Book Series Editors:

  1. Susan Brooks

ISBN Information

Print ISBN: 9780470518519

Online ISBN: 9781119978848

SEARCH

Keywords:

  • theory and simulations - of STEM imaging;
  • annular dark-field (ADF) detector use - first detection modes, by Crewe and co-workers;
  • most popular STEM imaging mode - using ADF STEM;
  • scattering, over all angular ranges - technique, referred as ADF STEM;
  • theoretical basis for image contrast in STEM imaging - ADF and bright-field (BF) imaging;
  • Z-contrast imaging of single atoms - and dark-field imaging technique;
  • STEM imaging, of crystalline materials - coherence in ADF imaging, atoms in crystal lattice;
  • incoherent imaging with dynamical scattering - multiple scattering, and beam propagation in sample;
  • strong dynamical diffraction - interpretation of coherent imaging technique, and Bloch wave analysis;
  • thermal diffuse scattering (TDS) - thermal lattice vibration effects, strength of Bragg beams

Summary

This chapter contains sections titled:

  • Introduction

  • Z-Contrast Imaging of Single Atoms

  • STEM Imaging Of Crystalline Materials

  • Incoherent Imaging with Dynamical Scattering

  • Thermal Diffuse Scattering

  • Methods of Simulation for ADF Imaging

  • Conclusions

  • References