5. Theory and Simulations of STEM Imaging
- Rik Brydson
Published Online: 26 JUL 2011
DOI: 10.1002/9781119978848.ch5
Copyright © 2011 John Wiley & Sons, Ltd
Book Title
Aberration-Corrected Analytical Transmission Electron Microscopy
Additional Information
How to Cite
Nellist, P. D. (2011) Theory and Simulations of STEM Imaging, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch5
Editor Information
Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK
Publication History
- Published Online: 26 JUL 2011
- Published Print: 16 SEP 2011
ISBN Information
Print ISBN: 9780470518519
Online ISBN: 9781119978848
- Summary
- Chapter
- References
Keywords:
- theory and simulations - of STEM imaging;
- annular dark-field (ADF) detector use - first detection modes, by Crewe and co-workers;
- most popular STEM imaging mode - using ADF STEM;
- scattering, over all angular ranges - technique, referred as ADF STEM;
- theoretical basis for image contrast in STEM imaging - ADF and bright-field (BF) imaging;
- Z-contrast imaging of single atoms - and dark-field imaging technique;
- STEM imaging, of crystalline materials - coherence in ADF imaging, atoms in crystal lattice;
- incoherent imaging with dynamical scattering - multiple scattering, and beam propagation in sample;
- strong dynamical diffraction - interpretation of coherent imaging technique, and Bloch wave analysis;
- thermal diffuse scattering (TDS) - thermal lattice vibration effects, strength of Bragg beams
Summary
This chapter contains sections titled:
Introduction
Z-Contrast Imaging of Single Atoms
STEM Imaging Of Crystalline Materials
Incoherent Imaging with Dynamical Scattering
Thermal Diffuse Scattering
Methods of Simulation for ADF Imaging
Conclusions
References