6. Details of STEM
- Rik Brydson
Published Online: 26 JUL 2011
Copyright © 2011 John Wiley & Sons, Ltd
Aberration-Corrected Analytical Transmission Electron Microscopy
How to Cite
Craven, A. (2011) Details of STEM, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch6
Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK
- Published Online: 26 JUL 2011
- Published Print: 16 SEP 2011
Book Series Editors:
- Susan Brooks
Print ISBN: 9780470518519
Online ISBN: 9781119978848
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