6. Details of STEM
- Rik Brydson
Published Online: 26 JUL 2011
DOI: 10.1002/9781119978848.ch6
Copyright © 2011 John Wiley & Sons, Ltd
Book Title
Aberration-Corrected Analytical Transmission Electron Microscopy
Additional Information
How to Cite
Craven, A. (2011) Details of STEM, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch6
Editor Information
Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK
Publication History
- Published Online: 26 JUL 2011
- Published Print: 16 SEP 2011
ISBN Information
Print ISBN: 9780470518519
Online ISBN: 9781119978848
- Summary
- Chapter
- References
Keywords:
- STEM, and other elements of STEM optical column - best use of corrected objective lens;
- probe size, probe current and probe angle relationship;
- chromatic aberration effect - dominant, both Cc and ΔE minimised;
- effect of small change in αopt - on intensity distribution in probe;
- effect of α on diffraction pattern - α, reduced below value of αopt;
- condenser system - and condenser optics, necessary finesse in control of α;
- scanning system - and principles of scanning system;
- drift, drift correction and smart acquisition – drift and image distortion;
- beam blanking - two basic uses of beam blanking in STEM;
- imaging using transmitted electrons - diffraction pattern, and any signal image specimen
Summary
This chapter contains sections titled:
Signal to Noise Ratio and Some of its Implications
The Relationships Between Probe Size, Probe Current and Probe Angle
The Condenser System
The Scanning System
The Specimen Stage
Post-Specimen Optics
Beam Blanking
Detectors
Imaging Using Transmitted Electrons
Signal Acquisition
Acknowledgements
References