7. Electron Energy Loss Spectrometry and Energy Dispersive X-ray Analysis

  1. Rik Brydson
  1. Rik Brydson and
  2. Nicole Hondow

Published Online: 26 JUL 2011

DOI: 10.1002/9781119978848.ch7

Aberration-Corrected Analytical Transmission Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy

How to Cite

Brydson, R. and Hondow, N. (2011) Electron Energy Loss Spectrometry and Energy Dispersive X-ray Analysis, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch7

Editor Information

  1. Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK

Author Information

  1. Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK

Publication History

  1. Published Online: 26 JUL 2011
  2. Published Print: 16 SEP 2011

Book Series:

  1. RMS-Wiley Imprint

Book Series Editors:

  1. Susan Brooks

ISBN Information

Print ISBN: 9780470518519

Online ISBN: 9781119978848

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Keywords:

  • electron energy loss spectrometry (EELS) - and energy dispersive X-ray (EDX) analysis;
  • EELS, absorption spectroscopy - measuring energy losses of incident electrons;
  • transmission electron microscopy (TEM) - concerned with EDX, than WDX;
  • de-excitation mechanisms for atom - having undergone K-shell ionization, by primary electrons;
  • components and location - of EDX detector in a TEM;
  • EDX detectors, to be withdrawn - or isolated via shutter mechanism, preventing detector flooded with X-rays;
  • using EELS in CTEM mode - much less straightforward, than for STEM;
  • elemental analysis, and quantification using EDX - identification of elements, EDX spectrum;
  • low loss EELS - plasmons, IB transitions and band gaps, and bulk plasmon excitation;
  • EDX and EELS spectral modelling - and total spectrum modelling

Summary

This chapter contains sections titled:

  • What is EELS and EDX?

  • Analytical Spectrometries in the Environment of the Electron Microscope

  • Elemental Analysis and Quantification Using EDX

  • Low Loss EELS – Plasmons, IB Transitions and Band Gaps

  • Core Loss EELS

  • EDX and EELS Spectral Modelling

  • Spectrum Imaging: EDX and EELS

  • Ultimate Spatial Resolution of EELS

  • Conclusion

  • References