8. Applications of Aberration-Corrected Scanning Transmission Electron Microscopy

  1. Rik Brydson
  1. Mervyn D. Shannon

Published Online: 26 JUL 2011

DOI: 10.1002/9781119978848.ch8

Book Title

Aberration-Corrected Analytical Transmission Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy

Additional Information

How to Cite

Shannon, M. D. (2011) Applications of Aberration-Corrected Scanning Transmission Electron Microscopy, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch8

Editor Information

  1. Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK

Author Information

  1. SuperSTEM Facility, STFC Daresbury Laboratories, Daresbury, Cheshire, UK

Publication History

  1. Published Online: 26 JUL 2011
  2. Published Print: 16 SEP 2011

Book Series:

  1. RMS-Wiley Imprint

Book Series Editors:

  1. Susan Brooks

ISBN Information

Print ISBN: 9780470518519

Online ISBN: 9781119978848

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CHAPTER TOOLS

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Keywords:

  • applications, of aberration-corrected STEM - and advent of aberration-corrected STEM;
  • high-angle annular dark-field (HAADF) - imaging mode of choice;
  • sample condition - samples for aberration-corrected STEM, being very clean;
  • HAADF imaging - intensity of feature in HAADF imaging, function of atomic number;
  • simultaneous SEM secondary electron imaging - with HAADF;
  • interfaces and extended defects (2-D) - planar interfaces, in semiconductor technology;
  • intracellular distribution of SWNTs - HAADF STEM image of SWNTs, within a lysosome;
  • energy dispersive X-ray (EDX) analysis and mapping - on FEGTEM/STEM instruments;
  • EELS, being preferred - on dedicated aberration-corrected STEM instruments;
  • aberration-corrected analytical STEM - and real-space crystallography and interpretable imaging of defect structures

Summary

This chapter contains sections titled:

  • Introduction

  • Sample Condition

  • HAADF Imaging

  • Conclusions

  • References

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