9. Aberration-Corrected Imaging in CTEM

  1. Rik Brydson
  1. Sarah J. Haigh1,2 and
  2. Angus I. Kirkland1

Published Online: 26 JUL 2011

DOI: 10.1002/9781119978848.ch9

Aberration-Corrected Analytical Transmission Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy

How to Cite

Haigh, S. J. and Kirkland, A. I. (2011) Aberration-Corrected Imaging in CTEM, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch9

Editor Information

  1. Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK

Author Information

  1. 1

    Department of Materials, University of Oxford, Oxford, UK

  2. 2

    University of Manchester, Materials Science Centre, Manchester, UK

Publication History

  1. Published Online: 26 JUL 2011
  2. Published Print: 16 SEP 2011

Book Series:

  1. RMS-Wiley Imprint

Book Series Editors:

  1. Susan Brooks

ISBN Information

Print ISBN: 9780470518519

Online ISBN: 9781119978848

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