9. Aberration-Corrected Imaging in CTEM

  1. Rik Brydson
  1. Sarah J. Haigh1,2,
  2. Angus I. Kirkland1

Published Online: 26 JUL 2011

DOI: 10.1002/9781119978848.ch9

Book Title

Aberration-Corrected Analytical Transmission Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy

Additional Information

How to Cite

Haigh, S. J. and Kirkland, A. I. (2011) Aberration-Corrected Imaging in CTEM, in Aberration-Corrected Analytical Transmission Electron Microscopy (ed R. Brydson), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119978848.ch9

Editor Information

  1. Leeds Electron Microscopy and Spectroscopy (LEMAS) Centre, Institute for Materials Research, SPEME, University of Leeds, Leeds, UK

Author Information

  1. 1

    Department of Materials, University of Oxford, Oxford, UK

  2. 2

    University of Manchester, Materials Science Centre, Manchester, UK

Publication History

  1. Published Online: 26 JUL 2011
  2. Published Print: 16 SEP 2011

Book Series:

  1. RMS-Wiley Imprint

Book Series Editors:

  1. Susan Brooks

ISBN Information

Print ISBN: 9780470518519

Online ISBN: 9781119978848

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CHAPTER TOOLS

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Keywords:

  • aberration-corrected imaging - in Conventional Transmission Electron Microscope (CTEM);
  • electron optical configuration of CTEM - different to that of STEM;
  • CTEM instruments, fitted with beam scan coils - providing CTEM and STEM imaging modes;
  • JEOL 2200MCO column fitted - imaging (CTEM) and STEM (probe forming) aberration-corrector elements;
  • optics, and instrumentation - for aberration-corrected CTEM;
  • phase contrast imaging difficulties, in CTEM - phase change, objective lens oscillating;
  • imaging theory - for a perfect lens;
  • wave aberration function - for uncorrected CTEM, effects of spherical aberration;
  • corrected imaging conditions - and high resolution CTEM images, contrast reversals and delocalisation;
  • aberration measurement - practical aberration correction, and aberration measurement accuracy

Summary

This chapter contains sections titled:

  • Introduction

  • Optics and Instrumentation for Aberration-Corrected CTEM

  • CTEM Imaging Theory

  • Corrected Imaging Conditions

  • Aberration Measurement

  • Indirect Aberration Compensation

  • Advantages of Aberration-Correction for CTEM

  • Conclusions

  • Acknowledgements

  • References

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