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Acronyms

  1. Marius Bâzu1 and
  2. Titu Băjenescu2

Published Online: 26 APR 2011

DOI: 10.1002/9781119990093.acron

Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems

Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems

How to Cite

Bâzu, M. and Băjenescu, T. (2011) Acronyms, in Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119990093.acron

Author Information

  1. 1

    National Institute for Microtechnologies, IMT-Bucharest, Romania

  2. 2

    C. F. C., Switzerland

Publication History

  1. Published Online: 26 APR 2011
  2. Published Print: 15 APR 2011

ISBN Information

Print ISBN: 9780470748244

Online ISBN: 9781119990093

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