4. Failure Analysis – How?

  1. Marius Bâzu1 and
  2. Titu Băjenescu2

Published Online: 26 APR 2011

DOI: 10.1002/9781119990093.ch4

Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems

Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems

How to Cite

Bâzu, M. and Băjenescu, T. (2011) Failure Analysis – How?, in Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119990093.ch4

Author Information

  1. 1

    National Institute for Microtechnologies, IMT-Bucharest, Romania

  2. 2

    C. F. C., Switzerland

Publication History

  1. Published Online: 26 APR 2011
  2. Published Print: 15 APR 2011

ISBN Information

Print ISBN: 9780470748244

Online ISBN: 9781119990093

SEARCH

Keywords:

  • failure analysis (FA);
  • failure mechanism (FM)

Summary

This chapter describes the failure analysis (FA) techniques, but first it recommends procedures for performing FA. It is necessary to have procedures in place, because the use of the FA techniques must be the result of a logical process, the final goal being to identify the failure mechanism (FM) and not to display results obtained with as many sophisticated FA methods as possible. In the second part of this chapter, each FA method mentioned in these procedures is detailed. A natural conclusion to this chapter is given by the use of FA techniques in studying the typical FMs for various technologies.

Controlled Vocabulary Terms

electron device manufacture; failure analysis