4. Failure Analysis – How?
Published Online: 26 APR 2011
Copyright © 2011 John Wiley & Sons, Ltd
Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems
How to Cite
Bâzu, M. and Băjenescu, T. (2011) Failure Analysis – How?, in Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems, John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119990093.ch4
- Published Online: 26 APR 2011
- Published Print: 15 APR 2011
Print ISBN: 9780470748244
Online ISBN: 9781119990093
- failure analysis (FA);
- failure mechanism (FM)
This chapter describes the failure analysis (FA) techniques, but first it recommends procedures for performing FA. It is necessary to have procedures in place, because the use of the FA techniques must be the result of a logical process, the final goal being to identify the failure mechanism (FM) and not to display results obtained with as many sophisticated FA methods as possible. In the second part of this chapter, each FA method mentioned in these procedures is detailed. A natural conclusion to this chapter is given by the use of FA techniques in studying the typical FMs for various technologies.
Controlled Vocabulary Terms
electron device manufacture; failure analysis