5. Native Point Defects and Doping in ZnO

  1. Cole W. Litton2,
  2. Donald C. Reynolds2,3 and
  3. Thomas C. Collins4
  1. Anderson Janotti and
  2. Chris G. Van de Walle

Published Online: 28 MAR 2011

DOI: 10.1002/9781119991038.ch5

Zinc Oxide Materials for Electronic and Optoelectronic Device Applications

Zinc Oxide Materials for Electronic and Optoelectronic Device Applications

How to Cite

Janotti, A. and Van de Walle, C. G. (2011) Native Point Defects and Doping in ZnO, in Zinc Oxide Materials for Electronic and Optoelectronic Device Applications (eds C. W. Litton, D. C. Reynolds and T. C. Collins), John Wiley & Sons, Ltd, Chichester, UK. doi: 10.1002/9781119991038.ch5

Editor Information

  1. 2

    Air Force Research Laboratory, Wright-Patterson Air Force Base, OH, USA

  2. 3

    Wright State University, Dayton, OH, USA

  3. 4

    Oklahoma State University, Stillwater, OK, USA

Author Information

  1. Materials Department, University of California, Santa Barbara, CA, USA

Publication History

  1. Published Online: 28 MAR 2011
  2. Published Print: 25 MAR 2011

Book Series:

  1. Wiley Series in Materials for Electronic and Optoelectronic Applications

Book Series Editors:

  1. Peter Capper5,
  2. Safa Kasap6 and
  3. Arthur Willoughby7

Series Editor Information

  1. 5

    SELEX Galileo Infrared Ltd, Southampton, UK

  2. 6

    University of Saskatchewan, Canada

  3. 7

    University of Southampton, UK

ISBN Information

Print ISBN: 9780470519714

Online ISBN: 9781119991038

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Keywords:

  • Native Point Defects and Doping in ZnO;
  • Theoretical Framework;
  • Donor Impurities;
  • Acceptor Impurities;
  • Isoelectronic Impurities;
  • density functional theory (DFT);
  • local density approximation (LDA);
  • generalized gradient approximation (GGA)

Summary

This chapter contains sections titled:

  • Introduction

  • Theoretical Framework

  • Native Point Defects

  • Donor Impurities

  • Acceptor Impurities

  • Isoelectronic Impurities

  • Acknowledgements

  • References